两块 NVME 固态组的 (soft) Raid-1, S.M.A.R.T.测试两块盘都没通过 (FAILED) :
- 第一块已达使用寿命 106%
- NVM subsystem reliability has been degraded
SMART/Health Information (NVMe Log 0x02)
Critical Warning: 0x04
Temperature: 34 Celsius
Available Spare: 100%
Available Spare Threshold: 10%
Percentage Used: 106%
Data Units Read: 30,712,672,589 [15.7 PB]
Data Units Written: 1,862,279,023 [953 TB]
Host Read Commands: 76,147,225,142
Host Write Commands: 9,769,033,638
Controller Busy Time: 52,392,054,374
Power Cycles: 11
Power On Hours: 24,101
Unsafe Shutdowns: 1
Media and Data Integrity Errors: 0
Error Information Log Entries: 144
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 34 Celsius
Temperature Sensor 2: 36 Celsius
- 第二块已达使用寿命 163%
- NVM subsystem reliability has been degraded
SMART/Health Information (NVMe Log 0x02)
Critical Warning: 0x04
Temperature: 39 Celsius
Available Spare: 100%
Available Spare Threshold: 10%
Percentage Used: 163%
Data Units Read: 47,306,232,682 [24.2 PB]
Data Units Written: 3,009,805,511 [1.54 PB]
Host Read Commands: 132,313,748,968
Host Write Commands: 41,306,780,960
Controller Busy Time: 141,500,864,939
Power Cycles: 19
Power On Hours: 32,831
Unsafe Shutdowns: 6
Media and Data Integrity Errors: 2
Error Information Log Entries: 259
Warning Comp. Temperature Time: 0
Critical Comp. Temperature Time: 0
Temperature Sensor 1: 39 Celsius
Temperature Sensor 2: 65 Celsius
有必要立刻迁移数据吗? 感谢🙏